F. Wenxiao

Low-frequency noise characteristics in the MOSFETs processed in 65 nm technology

Liu Yuan, L. Yurong, He Yujuan, 2016 .

A study of the mechanical reliability of a MEMS microphone

F. Wenxiao, Huang Qinwen, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Total Ionizing Dose Radiation Effects in the P-Type Polycrystalline Silicon Thin Film Transistors*

Liu Yuan, Y. En, Yurong Liu, 2017 .

Analysis of low frequency noise characteristics in p-type polycrystalline silicon thin film transistors

Y. En, Yuan Liu, F. Wenxiao, 2017 .

A new broadband circularly polarized dielectric resonator antenna: Using parasitic elements

L. Wang, Y. En, Yan Chen, 2021 .