B. L. Yeoh

Fault isolation using Electrically-enhanced LADA (EeLADA)

Hu Hao, Jeffrey Lam, S. H. Goh, 2015, 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Fault isolation of digital scan logic without ‘scan diagnosis’

Hu Hao, Jeffrey Lam, S. H. Goh, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Debugging MBIST hard fails without bitmapping

Hu Hao, Jeffrey Lam, S. H. Goh, 2015, 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.

An effective broken scan chain diagnosis flow combining software and hardware solutions for systematic failures

T. Herrmann, S. H. Goh, B. L. Yeoh, 2012, 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

A non destructive scan diagnosis based fault isolation technique verification method using infrared laser stimulation on wafer level

Jeffrey Lam, S. H. Goh, B. L. Yeoh, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Dynamic optical beam induced current variation mapping: A fault isolation technique

Zhao Lin, Hu Hao, B. L. Yeoh, 2020 .

Optimization of an Artificial Neural Network System for the Prediction of Failure Analysis Success

Hao Hu, Lin Zhao, S. H. Goh, 2019, Microelectronics Reliability.

Wafer-level fault isolation approach to debug integrated circuits JTAG failures

Hu Hao, Jeffrey Lam, S. H. Goh, 2014, Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

A detailed analysis scheme to interpret multiple photon emissions micrograph for improved diagnostic resolution on open defects

Hu Hao, Jeffrey Lam, S. H. Goh, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).