S.J. Bull

Control of Self-Heating in Thin Virtual Substrate Strained Si MOSFETs

M. Ostling, P.-E. Hellstrom, E. Kasper, 2006, IEEE Transactions on Electron Devices.

Impact of strained-Si thickness and Ge out-diffusion on gate oxide quality for strained-Si surface channel n-MOSFETs

Y. Tsang, A. O'Neill, S. Chattopadhyay, 2006, IEEE Transactions on Electron Devices.