T. Takebe

Slip defect generation on GaAs wafers during high temperature process: a thermoelastic study from a crystallographic viewpoint

M. Kiyama, T. Takebe, S. Sawada, 1996, GaAs IC Symposium IEEE Gallium Arsenide Integrated Circuit Symposium. 18th Annual Technical Digest 1996.

Detailed characterization of deep centers in CdTe: Photoionization and thermal ionization properties

Hiroyuki Matsunami, H. Matsunami, T. Takebe, 1982 .