U. Kollmer

Explanation and quantitative model for the matching behaviour of poly-silicon resistors

R. Thewes, W. Weber, B. Holzapfl, 1998, International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).

Mismatch of MOSFET small signal parameters under analog operation

R. Thewes, U. Kollmer, R. Brederlow, 2000, IEEE Electron Device Letters.

Key attributes of an SRAM testing strategy required for effective process monitoring

D. Schmitt-Landsiedel, J. Khare, S. Griep, 1993, Records of the 1993 IEEE International Workshop on Memory Testing.