Sungmo Kim

发表

Prediction of Plasma Etching Using a Classification-Based Neural Network

Byungwhan Kim, Sungmo Kim, 2004 .

Use of Neural Network to Control a Refractive Index of SiN Film Deposited by Plasma Enhanced Chemical Vapor Deposition

Byungwhan Kim, Byungwhan Kim, Sungmo Kim, 2004 .

Modelling of plasma etching using a generalized regression neural network

Kunho Kim, Byungwhan Kim, Byungwhan Kim, 2003 .

GA-optimized backpropagation neural network with multi-parameterized gradients and applications to predicting plasma etch data

Byungwhan Kim, Byungwhan Kim, Sungmo Kim, 2005 .

Low pressure plasma etching of silicon carbide

Byung-Teak Lee, Byungwhan Kim, Sungmo Kim, 2005 .

Modeling SiC surface roughness using neural network and atomic force microscopy

Byung-Teak Lee, Byungwhan Kim, Sungmo Kim, 2004 .

Wavelet-based uniformity of plasma etching surface

Bhum Joon Kim, Myo Taeg Lim, Sungmo Kim, 2003 .

Backpropergation Classification of Statistiscally Designed Experiment

Sungmo Kim, Byungwhan Kim, Byungwhan Kim, 2002 .