B. Tracy

The Effect of Metal Film Topography and Lithography on Grain Size Distributions and on Electromigration Performance

R. C. Smith, R. C. Smith, Bruce Euzent, 1987, 25th International Reliability Physics Symposium.

Selected area polishing for precision TEM sample preparation

R. Gronsky, B. Tracy, J. Liu, 1993, Microscopy research and technique.

HIGH RESOLUTION ELECTRON MICROSCOPY EVIDENCE FOR THE DIRECT BONDING OF BONE TO HYDROXYLAPATITE

R. Doremus, B. Tracy, 1986 .

Specimen preparation for transmission electron microscopy of materials III : symposium held December 5-6, 1991, Boston, Mass., U.S.A.

Bryan Tracy, J. Bravman, R. Anderson, 1988 .

Measurement uncertainty in nanometrology: leveraging attributes of TEM and CD AFM

G. Dahlen, M. Osborn, B. Tracy, 2007, 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007.

Direct electron microscopy studies of the bone-hydroxylapatite interface.

R. Doremus, B. Tracy, Bryan Tracy, 1984, Journal of biomedical materials research.

Self-aligned nickel, cobalt/tantalum nitride stacked-gate pMOSFETs fabricated with a low temperature process after metal electrode deposition

P. Besser, M. Lin, E. Adem, 2003 .

Use of advanced analytical techniques for VLSI failure analysis

B. Tracy, I. Banerjee, P. Davies, 1990, 28th Annual Proceedings on Reliability Physics Symposium.

Titanium-Silicon Interactions During Ion Beam Irradiation

P. Davies, B. Tracy, R. Shukla, 1986 .