ChungSam Jun

Tunable electrical properties of multilayer HfSe2 field effect transistors by oxygen plasma treatment.

D. Youn, In-yeal Lee, Gil-Ho Kim, 2017, Nanoscale.

Exact and reliable overlay metrology in nanoscale semiconductor devices using an image processing method

Jung-Hwan Kim, Janghee Lee, Chae-Ho Shin, 2014 .

7.9 1/2.74-inch 32Mpixel-Prototype CMOS Image Sensor with 0.64μ m Unit Pixels Separated by Full-Depth Deep-Trench Isolation

Ho-Kyu Kang, Jinyoung Kim, H. Ji, 2021, 2021 IEEE International Solid- State Circuits Conference (ISSCC).