Karl Hofmann

Comprehensive statistical investigation of STT-MRAM thermal stability

Karl Hofmann, Klaus Knobloch, Christian Peters, 2014, 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.

A method of operating a memory device

Michael Gössel, Karl Hofmann, Thomas Kern, 2016 .

SWIR detectors for night vision at AIM

A. Sieck, Johann Ziegler, M. Benecke, 2014, Defense + Security Symposium.

A voltage scaling model for performance evaluation in digital CMOS circuits

Christian Pacha, Karl Hofmann, Joerg Berthold, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).

Techniques for verifying a reliability of a memory

Peter Huber, Karl Hofmann, Siegmar Köppe, 2012 .

Image sensor for security applications with on-chip data authentication

Kurt Eberhardt, Karl Hofmann, Peter Stifter, 2006, SPIE Defense + Commercial Sensing.

A 65 nm test structure for SRAM device variability and NBTI statistics

Doris Schmitt-Landsiedel, Martin Ostermayr, Karl Hofmann, 2009, ESSDERC 2009.

A method to analyze the impact of fast-recovering NBTI degradation on the stability of large-scale SRAM arrays

Doris Schmitt-Landsiedel, Stefan Drapatz, Georg Georgakos, 2011 .

Impact of fast-recovering NBTI degradation on stability of large-scale SRAM arrays

Doris Schmitt-Landsiedel, Stefan Drapatz, Georg Georgakos, 2010, 2010 Proceedings of the European Solid State Device Research Conference.