N. T. Bagraev

Delta-Doping of Monocrystalline Semiconductors by Al and Sb Implantation Using FIB Resistless Lithography

E. E. Zhurkin, V. Zhukov, A. Titov, 2004 .

Evaluation of focused O+ ion beams as a tool for making resist masks by reactive etching

M. M. Nesterov, V. Zhukov, A. Titov, 2006 .

The study of the influence of deep level defects on GaAs epilayer electrophysical parameters with electron beam and photoelectron paramagnetic resonance methods

M. Sobolev, N. T. Bagraev, S. Konnikov, 1985 .

Electron localization on defects and optical nuclear polarization in disordered and semimagnetic semiconductors

N. T. Bagraev, 1983 .

Gold Solid Solution Decay in Silicon. II. Optical Nuclear Polarization Data

A. Lebedev, N. T. Bagraev, L. Vlasenko, 1985, September 16.

Defects in semiconductors I, NCDS-1 : proceedings of the 1st National Conference on Defects in Semiconductors, held in St. Petersburg, Russia, April 26-30, 1992

N. T. Bagraev, 1993 .