A. Shard

发表

Simulation method for investigating the use of transition-edge sensors as spectroscopic electron detectors

S. Withington, D. Goldie, K. Patel, 2021, Superconductor Science and Technology.

Study of the end‐group contribution to ToF‐SIMS and G‐SIMS spectra of poly (lactic acid) using deuterium labelling

M. Alexander, R. Ogaki, M. C. Davies, 2007 .

Chemical and structural identification of material defects in superconducting quantum circuits

S. de Graaf, T. Lindström, A. Shard, 2022, Materials for Quantum Technology.

XPS topofactors: determining overlayer thickness on particles and fibres

A. Shard, A. Shard, S. Spencer, 2009 .

Characterization of buried interfaces using Ga Kα hard X-ray photoelectron spectroscopy (HAXPES).

B. Spencer, D. Binks, R. Oliver, 2022, Faraday discussions.

Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials

F. Green, I. Gilmore, P. Brewer, 2007 .

Dual beam organic depth profiling using large argon cluster ion beams

H. Jungnickel, A. Luch, M. Holzweber, 2014, Surface and interface analysis : SIA.

Depth profiling of Irganox‐3114 nanoscale delta layers in a matrix of Irganox‐1010 using conventional Cs+ and O2+ ion beams

B. R. Chakraborty, A. Shard, M. Dalai, 2014 .

Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size.

M. Seah, R. Havelund, I. Gilmore, 2015, The Analyst.

VAMAS interlaboratory study on organic depth profiling

M. Seah, S. Ray, A. Shard, 2011 .

VAMAS interlaboratory study on organic depth profiling. Part I: Preliminary report

J. L. S. Lee, S. Ray, I. Gilmore, 2011 .

Depth resolution and inhomogeneity of the sputtering dose with sample rotation and ion beam rastering

M. Seah, A. Shard, 2011 .

Topography and field effects in secondary ion mass spectrometry Part II: insulating samples

J. L. S. Lee, M. Seah, A. Shard, 2012 .

Predicting the wettability of patterned ITO surface using ToF‐SIMS images

J. L. S. Lee, S. Ray, A. Shard, 2010 .

A demonstration of Auger electron emission stimulated by secondary radiation: implications for x-ray standing-wave analysis of surfaces

B. Cowie, A. Shard, 1998 .

Surface and interface structure of quasi-free standing graphene on SiC

W. Strupinski, O. Kazakova, C. Melios, 2016, 1804.09492.

Summary of ISO/TC 201 standard: ISO 19668—Surface chemical analysis—X‐ray photoelectron spectroscopy—Estimating and reporting detection limits for elements in homogeneous materials

C. Clifford, A. Shard, 2018 .

Simulation method for investigating the use of transition-edge sensors as spectroscopic electron detectors

S. Withington, D. Goldie, K. Patel, 2021, Superconductor Science and Technology.