Shigenobu Maeda
发表
You-Seung Jin,
Jung-A Choi,
Kwang-Pyuk Suh,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
Suman Datta,
Arun V. Thathachary,
Krishna K. Bhuwalka,
2015,
IEEE Electron Device Letters.