A. Veloso
发表
P. Wambacq,
A. Mercha,
G. Van der Plas,
2013,
2013 IEEE International Electron Devices Meeting.
R. Rooyackers,
L. Witters,
N. Collaert,
2008,
2008 IEEE International SOI Conference.
A. Vandooren,
R. Rooyackers,
E. Simoen,
2015,
2015 30th Symposium on Microelectronics Technology and Devices (SBMicro).
E. Simoen,
C. Claeys,
A. Veloso,
2012,
2012 IEEE International SOI Conference (SOI).
P. Wambacq,
A. Mercha,
J. Ryckaert,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
G. Groeseneken,
E. Simoen,
C. Claeys,
2012,
2012 IEEE International SOI Conference (SOI).
G. Groeseneken,
E. Simoen,
P. Blomme,
2012,
IEEE Transactions on Electron Devices.
A. Veloso,
Federico Alves,
P. Santos,
1994
.
E. Simoen,
C. Claeys,
A. Veloso,
2012,
IEEE Electron Device Letters.
G. Bouche,
J. Ryckaert,
D. Mocuta,
2018,
2018 IEEE Symposium on VLSI Technology.
J. Ryckaert,
T. Chiarella,
N. Horiguchi,
2020,
2020 IEEE Symposium on VLSI Technology.
J. Ryckaert,
E. Vecchio,
N. Waldron,
2016,
2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S).
L. Witters,
N. Waldron,
N. Collaert,
2016,
SPIE Advanced Lithography.
H. Tigelaar,
T. Chiarella,
J. Ramos,
2006,
2006 International Electron Devices Meeting.
N. Collaert,
A. Veloso,
S. Biesemans,
2009,
2009 IEEE International SOI Conference.
FUSI Specific Yield Monitoring Enabling Improved Circuit Performance and Fast Feedback to Production
T. Hoffmann,
H. Tigelaar,
L. Witters,
2007,
2007 IEEE International Conference on Microelectronic Test Structures.
E. Simoen,
G. Hellings,
E. Vecchio,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
R. Rooyackers,
N. Collaert,
R. Jonckheere,
2004,
IEEE Electron Device Letters.
C. Vrancken,
A. Veloso,
S. Biesemans,
2006,
IEEE Electron Device Letters.
J. Ryckaert,
D. Mocuta,
G. Eneman,
2018,
Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.
B. Parvais,
B. Kaczer,
E. Simoen,
2016,
2016 IEEE Symposium on VLSI Technology.
E. Simoen,
C. Claeys,
N. Horiguchi,
2012,
IEEE Electron Device Letters.
B. Parvais,
R. Rooyackers,
K. Ronse,
2008,
2008 IEEE International Electron Devices Meeting.
R. Rooyackers,
A. Veloso,
M. Jurczak,
2002,
32nd European Solid-State Device Research Conference.
E. Simoen,
C. Claeys,
T. Nicoletti,
2013,
IEEE Transactions on Electron Devices.
T. Chiarella,
C. Vrancken,
A. Veloso,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
G. Hellings,
N. Collaert,
D. Linten,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
R. Rooyackers,
B. Kaczer,
S. Locorotondo,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
S. Locorotondo,
H. Bender,
T. Chiarella,
2006,
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers..
S. De Gendt,
S. Van Elshocht,
A. Akheyar,
2007,
2007 IEEE International Electron Devices Meeting.
S. Van Elshocht,
P. Lehnen,
C. Vrancken,
2007,
2007 IEEE Symposium on VLSI Technology.
D. Mocuta,
R. Ritzenthaler,
W. Vandervorst,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
E. Simoen,
E. Vecchio,
H. Bender,
2013,
2013 Symposium on VLSI Technology.
R. Rajagopalan,
K. Ronse,
S. Locorotondo,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
E. Augendre,
A. Veloso,
S. Biesemans,
2004,
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..
H. Bender,
G. Eneman,
N. Horiguchi,
2011,
2011 Symposium on VLSI Technology - Digest of Technical Papers.
B. Kaczer,
T. Grasser,
G. Hellings,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
R. Degraeve,
A. Veloso,
M. Jurczak,
2003,
ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003..
S. Locorotondo,
T. Chiarella,
C. Vrancken,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..