Jeffrey D. Black

Modeling of Single Event Transients With Dual Double-Exponential Current Sources: Implications for Logic Cell Characterization

William H. Robinson, Daniel B. Limbrick, Dolores A. Black, 2015, IEEE Transactions on Nuclear Science.

Motion and ranging sensor system for through-the-wall surveillance system

Jeffrey D. Black, 2002, SPIE Defense + Commercial Sensing.

Impact of ion-induced transients on high-speed dual-complementary Flip-Flop designs

William H. Robinson, Daniel B. Limbrick, Dolores A. Black, 2011, 2011 International Reliability Physics Symposium.

Best Practices in Radiation Hardening by Design: CMOS

Jeffrey D. Black, 2012 .

Using MRED to Screen Multiple-Node Charge-Collection Mitigated SOI Layouts

Ronald D. Schrimpf, John Teifel, Marty R. Shaneyfelt, 2019, IEEE Transactions on Nuclear Science.

Application of a novel test system to characterize single-event transients at cryogenic temperatures

Bharat L. Bhuva, Lloyd W. Massengill, Michael L. Alles, 2009, 2009 International Semiconductor Device Research Symposium.

DFF Layout Variations in CMOS SOI—Analysis of Hardening by Design Options

Dolores A. Black, Jeffrey D. Black, Robert A. Reed, 2020, IEEE Transactions on Nuclear Science.

Automated document analysis system

Jeffrey D. Black, Robert Dietzel, David Hartnett, 2002, SPIE Defense + Commercial Sensing.

Impact of logic synthesis on soft error vulnerability using a 90-nm bulk CMOS digital cell library

Arthur F. Witulski, William H. Robinson, Daniel B. Limbrick, 2011, 2011 Proceedings of IEEE Southeastcon.