Wilfried Vandervorst

Fabrication and use of metal tip and tip-on-tip probes for AFM-based device analysis

Thomas Hantschel, Peter De Wolf, Thomas Trenkler, 1998, Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components.

Characterization of silicon cantilevers with integrated pyramidal metal tips in atomic force microscopy

Thomas Hantschel, Peter De Wolf, Thomas Trenkler, 1999, Design, Test, Integration, and Packaging of MEMS/MOEMS.

(Invited) Optimization of WAl2O3Cu(-Te) Material Stack for High-Performance Conductive-Bridging Memory Cells

Wilfried Vandervorst, Michel Houssa, Karl Opsomer, 2013 .

Mounting of molded AFM probes by soldering

Stefan Slesazeck, Uwe Pape, Thomas Hantschel, 2000, SPIE MOEMS-MEMS.

ARIBA, an all round ion beam acquisition program

Wilfried Vandervorst, Bert Brijs, Jeroen Deleu, 1997 .

Key Issues for the Development of a Ge CMOS Device in an Advanced IC Circuit

Paul Zimmerman, Eddy Simoen, Cedric Huyghebaert, 2006 .

Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations

Geert Hellings, Trudo Clarysse, Kristin De Meyer, 2011 .

Fabrication of conductive atomic force microscope probes and their evaluation for carrier mapping

Wilfried Vandervorst, Sywert Brongersma, Pierre Eyben, 2003, SPIE Microtechnologies.

Peel-off probe: a cost-effective probe for electrical atomic force microscopy

Mingwei Xu, Stefan Slesazeck, Thomas Hantschel, 2000, SPIE MOEMS-MEMS.

Characterization of conductive probes for atomic force microscopy

Egbert Oesterschulze, Thomas Hantschel, Wilfried Vandervorst, 1999, Design, Test, Integration, and Packaging of MEMS/MOEMS.

Fabrication of a full metal AFM probe and its applications for Si and InP device analysis

Mingwei Xu, Thomas Hantschel, Wilfried Vandervorst, 1999, Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components.