Shuang-Yuan Chen

发表

Improvement of Printed Circuit Board Assembly Process in 2.4GHz RF Circuit Products

Mu-Chun Wang, Zhen-Ying Hsieh, Ting-Yu Yang, 2008 .

TCAD SIMULATION OF USING POCKET IMPLANT IN 50NM N-MOSFETS

Shuang-Yuan Chen, Heng-Sheng Huang, Yu-Hsin Chang, 2004 .

Heat stress exposing performance of deep-nano HK/MG nMOSFETs using DPN or PDA treatment

Shuang-Yuan Chen, Shea-Jue Wang, Mu-Chun Wang, 2015, Microelectron. Reliab..

Design of a 0.18um Stable Non-Volatile Boost Circuit in High/Low Temperature Operation

Mu-Chun Wang, Zhen-Ying Hsieh, Shuang-Yuan Chen, 2007 .

Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs

Shuang-Yuan Chen, Jia-Min Shieh, Heng-Sheng Huang, 2009, Microelectron. Reliab..

Investigation of Dicing Saw Methods Impacting Back-End Assembly Process

Mu-Chun Wang, Zhen-Ying Hsieh, Shuang-Yuan Chen, 2008 .

A 2.4-GHz 0.18μm Full-CMOS Single-Stage Class-E Power Amplifier With Temperature Effect for ISM Band Wireless Communication

Mu-Chun Wang, Zhen-Ying Hsieh, Shuang-Yuan Chen, 2007 .

Characteristics of UWB Bands Measurement, Human Effect, and Power Absorption

Shuang-Yuan Chen, Jwo-Shiun Sun, Guan-Yu Chen, 2006, IEEE International Workshop on Antenna Technology Small Antennas and Novel Metamaterials, 2006..

Layout Dependence of ESD Characteristics on High Voltage LDMOS Transistors

Mu-Chun Wang, Shuang-Yuan Chen, Yeh-Ning Jou, 2008 .

On the reverse short‐channel effect and threshold voltage roll‐off controls for 90 nm node MOSFETs

Shuang-Yuan Chen, Chuan-Hsi Liu, Sam Chou, 2007 .

COMPARISON OF SINGLE AND DOUBLE POCKET DEVICES ON DEEP SUBMICRON N-MOSFET FOR MIXED SIGNAL APPLICATIONS

Shuang-Yuan Chen, Heng-Sheng Huang, Ze-Wei Jhou, 2004 .

Transistor variability after CHC and NBTI stress in 90 nm pMOSFET technology

Shuang-Yuan Chen, Heng-Sheng Huang, Sam Chou, 2009 .

Correcting Front-End RF Impedance Mismatch for 2.4GHz Wireless Long-Distance Data Transmission

Mu-Chun Wang, Zhen-Ying Hsieh, Chia-Hao Tu, 2008 .

A Study on Tunneling Current of ONO Films and Data Retention Effects in Flash Memories

Shuang-Yuan Chen, Heng-Sheng Huang, Yen-Ching Wu, 2004 .

Avoidance of Bonding Pad Contamination Affecting Back-End Assembly Process

Mu-Chun Wang, Zhen-Ying Hsieh, Shuang-Yuan Chen, 2008 .

Simulation and Improvement of 5GHz Power Divider on FR-4 PCB

Mu-Chun Wang, Zhen-Ying Hsieh, Shuang-Yuan Chen, 2008 .

Promoting of charged-device model/electrostatic discharge immunity in the dicing saw process

Shuang-Yuan Chen, Mu-Chun Wang, Chuan-Hsi Liu, 2010, Microelectron. Reliab..

Tuning Test Voltages and Frequencies of Test Program to Save Test Time of Flash Memories

Shuang-Yuan Chen, Hung-Wen Chen, Shao-Min Ho, 2008 .

Back-Side Wafer Grinding Quality Affecting Back-End Assembly Process for LCD Driver ICs

Mu-Chun Wang, Zhen-Ying Hsieh, Shuang-Yuan Chen, 2008 .

A 5.8GHz Band-Pass Filter With an Active Inductor Through 0.18μm Full-CMOS Process for Wireless Transceivers

Mu-Chun Wang, Zhen-Ying Hsieh, Shuang-Yuan Chen, 2007 .