M. Kasai

Evidence of channel profile modification due to implantation damage studied by a new method, and its implication to reverse short channel effects of nMOSFETs

T. Ochiai, K. Nishi, H. Matsuhashi, 1995, Proceedings of International Electron Devices Meeting.

Fine Pitch and Low Material Readout Bus for the Silicon Pixel Detector in the PHENIX Vertex Tracker

H. En'yo, F. Gastaldi, Y. Onuki, 2009, IEEE Transactions on Nuclear Science.

Centrality-Dependent Modification of Jet-Production Rates in Deuteron-Gold Collisions at √[s(NN)]=200 GeV.

J. Sziklai, J. Velkovska, T. Ichihara, 2015, Physical review letters.

Heavy-flavor electron-muon correlations in p+p and d+Au collisions at sNN =200 GeV

J. Sziklai, A. K. Mohanty, K. S. Lee, 2013, 1311.1427.