G. Boiteux

High temperature aging of enameled copper wire — Relationships between chemical structure and electrical behavior

G. Boiteux, G. Seytre, A. Serghei, 2011, 2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena.

Ion mobility time-of-flight measurements: isolating the mobility of charge carriers during an epoxy–amine reaction

David E. Kranbuehl, Gérard Seytre, G. Boiteux, 2004 .