Valentin Gherman
发表
Luigi Dilillo,
Emna Farjallah,
Jean-Marc Armani,
2019,
Microelectronics Reliability.
Arnaud Virazel,
Patrick Girard,
Serge Pravossoudovitch,
2018,
2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS).
Valentin Gherman,
Yannick Bonhomme,
Samuel Evain,
2010
.
Valentin Gherman,
Yannick Bonhomme,
Samuel Evain,
2013,
J. Electron. Test..
Jürgen Schlöffel,
Valentin Gherman,
Hans-Joachim Wunderlich,
2007,
GLSVLSI '07.
Valentin Gherman,
Bastien Giraud,
Samuel Evain,
2020,
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE).
Valentin Gherman,
Mickael Cartron,
Yannick Bonhomme,
2009,
2009 Design, Automation & Test in Europe Conference & Exhibition.
Valentin Gherman,
Samuel Evain,
2012
.
Valentin Gherman,
Yannick Bonhomme,
Samuel Evain,
2010,
2010 IEEE 16th International On-Line Testing Symposium.
Valentin Gherman,
Yannick Bonhomme,
Samuel Evain,
2012,
2012 17th IEEE European Test Symposium (ETS).
Lirida A. B. Naviner,
Valentin Gherman,
Alexandre Valentian,
2014,
2014 19th IEEE European Test Symposium (ETS).
Valentin Savin,
Valentin Gherman,
Samuel Evain,
2014,
2013 18th IEEE European Test Symposium (ETS).
Luigi Dilillo,
Emna Farjallah,
Jean-Marc Armani,
2017,
2017 IEEE International Test Conference (ITC).
Jürgen Schlöffel,
Valentin Gherman,
Hans-Joachim Wunderlich,
2006,
Eleventh IEEE European Test Symposium (ETS'06).
Valentin Gherman,
Stéphane Chevobbe,
Yannick Bonhomme,
2011,
2011 Design, Automation & Test in Europe.
Valentin Gherman,
Fabrice Auzanneau,
Yannick Bonhomme,
2011,
29th VLSI Test Symposium.
Valentin Gherman,
Samuel Evain,
V. Gherman,
2013,
Journal of Electronic Testing.
Friedrich Hapke,
Valentin Gherman,
Hans-Joachim Wunderlich,
2004,
2004 International Conferce on Test.
Luigi Dilillo,
Emna Farjallah,
Jean-Marc Armani,
2017,
2017 22nd IEEE European Test Symposium (ETS).
Valentin Gherman,
Yannick Bonhomme,
2010
.
Luigi Dilillo,
Emna Farjallah,
Jean-Marc Armani,
2018,
2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS).
Lirida A. B. Naviner,
Valentin Gherman,
Ivan Miro Panades,
2014,
2014 IEEE 20th International On-Line Testing Symposium (IOLTS).
Scan design with shadow flip-flops for low performance overhead and concurrent delay fault detection
Lirida A. B. Naviner,
Valentin Gherman,
Yannick Bonhomme,
2013,
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE).
Jürgen Schlöffel,
Valentin Gherman,
Hans-Joachim Wunderlich,
2006,
Eleventh IEEE European Test Symposium (ETS'06).
Valentin Gherman,
Yannick Bonhomme,
Samuel Evain,
2011,
2011 IEEE 17th International On-Line Testing Symposium.
Jürgen Schlöffel,
Valentin Gherman,
Hans-Joachim Wunderlich,
2005,
23rd IEEE VLSI Test Symposium (VTS'05).