Dongsik Kong

Differential Ideality Factor Technique for Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors

Dong Myong Kim, Jaehyeong Kim, Dae Hwan Kim, 2012, IEEE Electron Device Letters.

Analytical Models for Drain Current and Gate Capacitance in Amorphous InGaZnO Thin-Film Transistors With Effective Carrier Density

Dong Myong Kim, Jaehyeong Kim, Dae Hwan Kim, 2011, IEEE Electron Device Letters.

The Effect of the Active Layer Thickness on the Negative Bias Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors

Dong Myong Kim, Dae Hwan Kim, Yong Woo Jeon, 2011, IEEE Electron Device Letters.