Ho-Young Kwak

Dependence of 1/f noise characteristics of NMOSFETs on body bias and temperature in sub-threshold region

Sung-Kyu Kwon, Jae-Hyung Jang, Song-Jae Lee, 2011, 2011 International Semiconductor Device Research Symposium (ISDRS).

A Novel BJT Structure Implemented Using CMOS Processes for High-Performance Analog Circuit Applications

Sung-Kyu Kwon, Jae-Hyung Jang, Hyuk-Min Kwon, 2012, IEEE Transactions on Semiconductor Manufacturing.

Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs

Sung-Kyu Kwon, Hi-Deok Lee, Ho-Young Kwak, 2013, IEICE Trans. Electron..