Min-Soo Yoo

Low-Frequency Noise Characteristics Under the OFF-State Stress

C. Kim, Yang‐Kyu Choi, Geon-Beom Lee, 2020, IEEE Transactions on Electron Devices.

Effect of OFF-State Stress on Gate-Induced Drain Leakage by Interface Traps in Buried-Gate FETs

C. Kim, Yang‐Kyu Choi, Jae Hur, 2019, IEEE Transactions on Electron Devices.

Analysis of damage curing in a MOSFET with joule heat generated by forward junction current at the source and drain

C. Kim, Yang‐Kyu Choi, Jun-Y. Park, 2020 .

STI stress-induced degradation of data retention time in DRAM and a new characterizing method for mechanical stress

S. Cha, Jae-Goan Jeong, Sung-Joo Hong, 2011, 2011 International Reliability Physics Symposium.

Overcoming the reliability limitation in the ultimately scaled DRAM using silicon migration technique by hydrogen annealing

Sungjoo Hong, Seong-Wan Ryu, T. Jang, 2017, 2017 IEEE International Electron Devices Meeting (IEDM).

Analysis of Drain Linear Current Turn-Around Effect in Off-State Stress Mode in pMOSFET

C. Kim, Hyun‐Yong Yu, Min-Soo Yoo, 2020, IEEE Electron Device Letters.

Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development

R. Baek, Hyeok Yun, Min-Soo Yoo, 2023, Advanced Intelligent Systems.

Highly Scalable Saddle-Fin (S-Fin) Transistor for Sub-50nm DRAM Technology

Kwang-Ok Kim, Seung-Chan Moon, Jin-Soo Kim, 2006, 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers..