Kevin Talley

Surface Cleanliness Characterization and Improvement for Semiconductor Manufacturing Applications

Kevin Talley, Scott York, Jihan Giad, 2015 .

Characterization of Elastic Modulus Across the (Al1–xScx)N System Using DFT and Substrate-Effect-Corrected Nanoindentation

Kevin Talley, Geoff L. Brennecka, Paul Constantine, 2018, IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control.