D.S.L. Mui

A review of III-V semiconductor based metal-insulator- semiconductor structures and devices

Hadis Morkoç, H. Morkoç, D. Mui, 1993 .

Mobility degradation and transferred electron effect in gallium arsenide and indium gallium arsenide

H. Morkoc, H. Morkoç, V. Arora, 1987, IEEE Transactions on Electron Devices.

Line-profile and critical-dimension monitoring using a normal incidence optical CD metrology

R. Lowe-Webb, R. Korlahalli, H. Sasano, 2004, IEEE Transactions on Semiconductor Manufacturing.