Liehr

Characterization of insulators by high-resolution electron-energy-loss spectroscopy: Application of a surface-potential stabilization technique.

Thiry, Liehr, Pireaux, 1986, Physical review. B, Condensed matter.

Defect microchemistry at the SiO2/Si interface.

Young, Hofmann, Liehr, 1987, Physical review letters.

Influence of thin SiO2 interlayers on chemical reaction and microstructure at the Ni/Si(111) interface.

Legoues, Liehr, Rubloff, 1986, Physical review. B, Condensed matter.

Correlation of Schottky-barrier height and microstructure in the epitaxial Ni silicide on Si(111).

Ho, Schmid, Legoues, 1985, Physical review letters.

Observation of long-wavelength interface phonons in a GaAs/AlGaAs superlattice.

Lucas, Vigneron, Lambin, 1986, Physical review letters.

CaF2/Si(111): Thin-film characterization by high-resolution electron-energy-loss spectroscopy.

Thiry, Liehr, Pireaux, 1986, Physical review. B, Condensed matter.

Silicon dioxide defects induced by metal impurities.

Lewis, Liehr, Dallaporta, 1990, Physical review. B, Condensed matter.