Uihyoung Lee

发表

Deep-Structured Machine Learning Model for the Recognition of Mixed-Defect Patterns in Semiconductor Fabrication Processes

Ghalia Tello, Omar Y. Al-Jarrah, Paul D. Yoo, 2018, IEEE Transactions on Semiconductor Manufacturing.

Randomized General Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps

Mohammed Ismail, Paul D. Yoo, Yousof Al-Hammadi, 2015, IEEE Transactions on Semiconductor Manufacturing.

Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps

Mohammed Ismail, Paul D. Yoo, Yousof Al-Hammadi, 2015, IEEE Transactions on Industrial Informatics.