E. Bury
发表
G. Groeseneken,
R. Degraeve,
B. Kaczer,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
B. Parvais,
B. Kaczer,
D. Linten,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
B. Parvais,
B. Kaczer,
N. Collaert,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
G. Groeseneken,
B. Kaczer,
P. Weckx,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
G. Groeseneken,
B. Kaczer,
P. Weckx,
2015,
2015 IEEE International Integrated Reliability Workshop (IIRW).
Dimitri Linten,
Robin Degraeve,
E. Bury,
2019,
IEEE Journal of Solid-State Circuits.
The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits
Dimitri Linten,
Philippe Roussel,
Tibor Grasser,
2016
.
R. Degraeve,
D. Lin,
N. Collaert,
2012,
2012 International Electron Devices Meeting.
Dimitri Linten,
Jacopo Franco,
Ben Kaczer,
2019
.
B. Kaczer,
D. Linten,
R. Ritzenthaler,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
A. Mercha,
D. Verkest,
P. Raghavan,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
B. Kaczer,
L. Witters,
N. Waldron,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
B. Kaczer,
G. Hellings,
L. Witters,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
B. Kaczer,
D. Vasileska,
R. Ritzenthaler,
2014,
2014 IEEE International Reliability Physics Symposium.
R. Degraeve,
D. Linten,
J. Swerts,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
B. Kaczer,
T. Grasser,
G. Hellings,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
R. D. Schrimpf,
D. Linten,
E. Bury,
2018,
IEEE Transactions on Nuclear Science.