V. Iyengar

Optimization of the MuGFET performance on Super Critical-Strained SOI (SC-SSOI) substrates featuring raised source/drain and dual CESL

B. Ghyselen, R. Rooyackers, E. Augendre, 2007, 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).

The measurement of the complete photoelastic fringe order using a spectral scanner

V. Iyengar, Rebecca J. Sanford, 1985 .