G. Astre

I-DLTS, electrical lag and low frequency noise measurements of trapping effects in AlGaN/GaN HEMT for reliability studies

L. Bary, J. G. Tartarin, B. Lambert, 2011, 2011 6th European Microwave Integrated Circuit Conference.

Generation-recombination traps in AlGaN/GaN HEMT analyzed by time-domain and frequency-domain measurements: Impact of HTRB stress on short term and long term memory effects

J. G. Tartarin, B. Lambert, J. Tartarin, 2013, 2013 IEEE International Wireless Symposium (IWS).

Trapping related degradation effects in AlGaN/GaN HEMT

J. G. Tartarin, B. Lambert, G. Astre, 2010, The 5th European Microwave Integrated Circuits Conference.