Ranbir Singh

发表

Toshihiko Hayashi, Yoshitaka Sugawara, D. Takayama, 2001, Proceedings of the 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 (IEEE Cat. No.01CH37216).

Siddarth Sundaresan, Ranbir Singh, Stoyan Jeliazkov, 2014, 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD).

Siddarth Sundaresan, Ranbir Singh, Stoyan Jeliazkov, 2013, 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD).

Sei-Hyung Ryu, Y. Sugawara, D. Takayama, 2001, Proceedings of the 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 (IEEE Cat. No.01CH37216).

Toshihiko Hayashi, Yoshitaka Sugawara, D. Takayama, 2002, Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics.

Robert S. Howell, Andy Walker, H. Hearne, 2008 .

Yoshitaka Sugawara, D. Takayama, Ranbir Singh, 2000, 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094).

Siddarth Sundaresan, Vamsi Mulpuri, Ranbir Singh, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

Allen R. Hefner, Jih-Sheng Lai, Alan Mantooth, 2001, 2001 International Semiconductor Device Research Symposium. Symposium Proceedings (Cat. No.01EX497).

Ranbir Singh, R. Singh, Ranbir Singh, 2006, Microelectron. Reliab..

Siddarth Sundaresan, Ranbir Singh, Madhuri Marripelly, 2013, 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD).

Toshihiko Hayashi, Yoshitaka Sugawara, D. Takayama, 2003 .

K. Asano, Sei-Hyung Ryu, Y. Sugawara, 2002 .