Romain Desplats

发表

Improving yield and reliability of FIB modifications using electrical testing

Romain Desplats, J. Benbrik, Bruno Benteo, 1998, Advanced Lithography.

Calculation of the optimal FIB milling and deposition operations for easier and faster circuit reconfiguration

Romain Desplats, Philippe Perdu, Timothee Dargnies, 2000 .

Dynamic Laser Stimulation Case Studies

Romain Desplats, Philippe Perdu, Kevin Sanchez, 2005, Microelectron. Reliab..

Method for individualizing a integrated circuit element

Romain Desplats, Philippe Perdu, 2000 .

Silicon Thinning and Polishing on Packaged Devices

Romain Desplats, Philippe Perdu, Dean Lewis, 2001, Microelectron. Reliab..

A process for the individualization of one element of an integrated circuit

Romain Desplats, Philippe Perdu, 2001 .

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Femtosecond Laser Ablation for Backside Silicon Thinning

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2004, Microelectron. Reliab..

NIR laser stimulation for dynamic timing analysis

Romain Desplats, Philippe Perdu, Dean Lewis, 2005, Microelectron. Reliab..

IR confocal laser microscopy for MEMS Technological Evaluation

Romain Desplats, Djemel Lellouchi, Philippe Perdu, 2002, Microelectron. Reliab..

Electron Beam Testing of FPGA Circuits

Romain Desplats, Bruno Benteo, Philippe Perdu, 1999 .

A New Versatile Testing Interface for Failure Analysis in Integrated Circuits

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2001, Microelectron. Reliab..

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Oxide charge measurements in EEPROM devices

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2005, Microelectron. Reliab..

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

FIB voltage contrast measurement for enhanced circuit repairs

Romain Desplats, Bruno Benteo, Philippe Perdu, 1999 .

Magnetic emission mapping for passive integrated components characterisation

Romain Desplats, Philippe Descamps, Philippe Perdu, 2003, Microelectron. Reliab..

Backside Hot Spot Detection Using Liquid Crystal Microscopy

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits?

Romain Desplats, Philippe Perdu, J. P. Roux, 2004, Microelectron. Reliab..

Means for obtaining an electronic circuit in a predetermined state

Romain Desplats, Philippe Perdu, 2002 .

Fault localization using time resolved photon emission and stil waveforms

Romain Desplats, Ketan Shah, Philippe Perdu, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

A method of comparison of stored of pixels existing images that represent at least one integrated circuit äquipotentielen

Romain Desplats, Philippe Perdu, 1999 .

Solar Cell Analysis with Light Emission and OBIC Techniques

Romain Desplats, Philippe Perdu, Kevin Sanchez, 2003, Microelectron. Reliab..

Time Resolved Photon Emission Processing Flow for IC Analysis

Romain Desplats, Philippe Perdu, Dean Lewis, 2004, Microelectron. Reliab..

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling

Franco Stellari, Alan J. Weger, Peilin Song, 2003, Microelectron. Reliab..

Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards

Romain Desplats, Philippe Perdu, C. Guérin, 2006, Microelectron. Reliab..

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation

Romain Desplats, Philippe Perdu, Dean Lewis, 2001, Microelectron. Reliab..

Shorter failure analysis using a new application of IDDQ for defect localization in ICs

Romain Desplats, J. Benbrik, François Marc, 1998, Advanced Lithography.

Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections

Romain Desplats, Dean Lewis, Pascal Fouillat, 2004, Microelectron. Reliab..

Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

Automated Diagnosis and Probing Flow for Fast Fault Localization in IC

Pascal Nouet, Florence Azaïs, Romain Desplats, 2004, Microelectron. Reliab..

Faster fault isolation using a dichotomy reduction of node candidates

Romain Desplats, Philippe Perdu, Guy Rolland, 2000 .

Light Emission to Time Resolved Emission For IC Debug and Failure Analysis

Romain Desplats, Philippe Perdu, Dean Lewis, 2005, Microelectron. Reliab..

Defect localization using voltage contrast IDDQ testing

Romain Desplats, Philippe Perdu, 1999 .

Automated PICA transistor channeling and spatial-temporal photon correlation for faster IC diagnosis

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2003, 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..

Implementation of TRE systems into Emission Microscopes

Romain Desplats, Alberto Tosi, Franco Zappa, 2004, Microelectron. Reliab..

New methodology for localizing faults in programmable and commercial circuits

Romain Desplats, François Marc, Philippe Perdu, 1997 .

Modeling Thermal Laser Stimulation

Romain Desplats, Philippe Perdu, X. Chauffleur, 2001, Microelectron. Reliab..

Electrical characterization and modification of a microelectroMechanical system (MEMS) for extended mechanical reliability and fatigue testing

Romain Desplats, J. Benbrik, Bruno Benteo, 1998 .

Magnetic microscopy for ICs failure analysis : comparative case studies using SQUID, GMR and MTJ systems

Romain Desplats, Philippe Perdu, Gérald Haller, 2004, Microelectron. Reliab..

Procedure individualization of one element of the integrated circuit.

Romain Desplats, Philippe Perdu, 2001 .

Method and installation for rapidly locating a fault in an integrated circuit

Romain Desplats, Philippe Perdu, 1998 .

Failure analysis of micro-heating elements suspended on thin membranes

Jérôme Courbat, Nico F. de Rooij, Romain Desplats, 2005, Microelectron. Reliab..

Method and device for thinning a circuit board integrated

Romain Desplats, Felix Beaudoin, 2001 .

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

A new approach for faster IC analysis with PICA: STPC-3D

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2003, Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.

Induced damages on CMOS and bipolar integrated structures under focused ion beam irradiation

Romain Desplats, J. Benbrik, Bruno Benteo, 1998 .

A review of sample backside preparation techniques for VLSI

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2000 .