P. Armstrong

Neutron soft error rate measurements in a 90-nm CMOS process and scaling trends in SRAM from 0.25-/spl mu/m to 90-nm generation

J. Tschanz, T. Karnik, P. Hazucha, 2003, IEEE International Electron Devices Meeting 2003.

Characterization of multi-bit soft error events in advanced SRAMs

J. Maiz, S. Hareland, P. Armstrong, 2003, IEEE International Electron Devices Meeting 2003.