Sassan Tabatabaei

发表

Embedded timing analysis: a soc infrastructure

André Ivanov, Sassan Tabatabaei, A. Ivanov, 2002, IEEE Design & Test of Computers.

A Temperature-to-Digital Converter for a MEMS-Based Programmable Oscillator With $< \pm \hbox{0.5-ppm}$ Frequency Stability and $< \hbox{1-ps}$ Integrated Jitter

Fred S. Lee, Jin-Tae Kim, Fari Assaderaghi, 2013, IEEE Journal of Solid-State Circuits.

Analog and Mixed Signal BIST: Too Much, Too Little, Too Late?

Adam Osseiran, Lee Song, Ken Posse, 2002, VTS.

A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices

André Ivanov, Baosheng Wang, Yong B. Cho, 2005, J. Electron. Test..

A built-in current monitor for testing analog circuit blocks

Sassan Tabatabaei, André Ivanov, 1999, ISCAS'99. Proceedings of the 1999 IEEE International Symposium on Circuits and Systems VLSI (Cat. No.99CH36349).

11.1 Dual-MEMS-resonator temperature-to-digital converter with 40 K resolution and FOM of 0.12pJK2

Carl Sechen, Vinod Menon, Samira Zali Asl, 2016, 2016 IEEE International Solid-State Circuits Conference (ISSCC).

Jitter generation and measurement for test of multi-Gbps serial IO

Michael Lee, Sassan Tabatabaei, Freddy Ben-Zeev, 2004, 2004 International Conferce on Test.

Silicon MEMS Oscillators for High-Speed Digital Systems

Aaron Partridge, Sassan Tabatabaei, 2010, IEEE Micro.

Jitter models and measurement methods for high-speed serial interconnects

André Ivanov, Sassan Tabatabaei, Andy Kuo, 2004, 2004 International Conferce on Test.

A DDJ calibration methodology for high-speed test and measurement equipments

Sassan Tabatabaei, André Ivanov, Touraj Farahmand, 2005, IEEE International Conference on Test, 2005..

Jitter models for the design and test of Gbps-speed serial interconnects

André Ivanov, Sassan Tabatabaei, Andy Kuo, 2004, IEEE Design & Test of Computers.

A temperature-to-digital converter for a MEMS-based programmable oscillator with better than ±0.5ppm frequency stability

Fred S. Lee, Jin-Tae Kim, Fari Assaderaghi, 2012, 2012 IEEE International Solid-State Circuits Conference.

A current integrator for BIST of mixed-signal ICs

André Ivanov, Sassan Tabatabaei, 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).

An embedded core for sub-picosecond timing measurements

André Ivanov, Sassan Tabatabaei, 2002, Proceedings. International Test Conference.

Power supply current monitoring techniques for testing PLLs

Sassan Tabatabaei, André Ivanov, Maneesha Dalmia, 1997, Proceedings Sixth Asian Test Symposium (ATS'97).

Multi-gigaHertz testing challenges and solutions

Karim Arabi, David C. Keezer, Sassan Tabatabaei, 2002, Proceedings 20th IEEE VLSI Test Symposium (VTS 2002).

Testing for floating gates defects in CMOS circuits

André Ivanov, Michel Renovell, Sassan Tabatabaei, 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).

A MEMS-Assisted Temperature Sensor With 20- μK Resolution, Conversion Rate of 200 S/s, and FOM of 0.04 pJK2

Samira Zaliasl, Amanpreet Singh, Carl Sechen, 2017, IEEE Journal of Solid-State Circuits.

A programmable MEMS-based clock generator with sub-ps jitter performance

Fred S. Lee, Fari Assaderaghi, Michael H. Perrott, 2011, 2011 Symposium on VLSI Circuits - Digest of Technical Papers.

Silicon MEMS oscillators for high speed digital systems

Aaron Partridge, Sassan Tabatabaei, A. Partridge, 2010, 2009 IEEE Hot Chips 21 Symposium (HCS).

Crosstalk bounded uncorrelated jitter (BUJ) for high-speed interconnects

André Ivanov, Sassan Tabatabaei, Andy Kuo, 2005, IEEE Transactions on Instrumentation and Measurement.

Jitter spectrum analysis using continuous time interval analyzer (CTIA)

Sassan Tabatabaei, Touraj Farahmand, Freddy Ben-Zeev, 2005, IEEE International Conference on Test, 2005..

An all-digital DFT scheme for testing catastrophic faults in PLLs

André Ivanov, Florence Azaïs, Michel Renovell, 2003, IEEE Design & Test of Computers.

Yield, overall test environment timing accuracy, and defect level trade-offs for high-speed interconnect device testing

André Ivanov, Baosheng Wang, Yong B. Cho, 2003, 2003 Test Symposium.

Design of a Tunable Differential Ring Oscillator With Short Start-Up and Switching Transients

André Ivanov, James Cicalo, Sassan Tabatabaei, 2007, IEEE Transactions on Circuits and Systems I: Regular Papers.