C. Hu

发表

Investigation of interconnect capacitance characterization using charge-based capacitance measurement (CBCM) technique and 3-D simulation

D. Sylvester, J.C. Chen, C. Hu, 1997, Proceedings of CICC 97 - Custom Integrated Circuits Conference.

Observation of a Charged Charmoniumlike Structure in e(+)e(-) -> (D* (D)over-bar*)(+/-)pi(-/+) at root s=4.26 GeV

T. C. Zhao, Y. J. Mao, J. L. Ping, 2013, 1308.2760.