Hao-Lin Chiu

Test and Analysis of the ESD Robustness for the Diode-Connected a-IGZO Thin Film Transistors

Ya-Hsiang Tai, Lu-Sheng Chou, Lu‐Sheng Chou, 2013, Journal of Display Technology.

Degradation of the Capacitance-Voltage Behaviors of the Low-Temperature Polysilicon TFTs under DC Stress

C. W. Lin, Ya-Hsiang Tai, Shih-Che Huang, 2007 .

Gap-Type a-Si TFTs for Front Light Sensing Application

Ya-Hsiang Tai, Lu-Sheng Chou, Hao-Lin Chiu, 2011, Journal of Display Technology.