Shih-Hung Chen

发表

Evaluation of co-design methodologies for ESD robust system design

Mirko Scholz, Shih-Hung Chen, Dimitri Linten, 2014 .

ESD diodes with Si/SiGe superlattice I/O finFET architecture in a vertically stacked horizontal nanowire technology

Naoto Horiguchi, Shih-Hung Chen, Dimitri Linten, 2018, 2018 48th European Solid-State Device Research Conference (ESSDERC).

Miscorrelation between IEC61000-4-2 type of HMM tester and 50 _x0019_$X HMM tester

Gerd Vandersteen, Mirko Scholz, Shih-Hung Chen, 2012 .

Investigation on NMOS-based power-rail ESD clamp circuits with gate-driven mechanism in a 0.13-µm CMOS technology

Shih-Hung Chen, Ming-Dou Ker, 2010, Microelectron. Reliab..

Abnormal ESD Damages Occur in Interface Circuits between Different Power Domains in ND-Mode MM ESD Stress

Shih-Hung Chen, Ming-Dou Ker, Che-Hao Chuang, 2006, 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

High power Al0.3Ga0.7As/In0.2Ga0.8As enhancement-mode PHEMT for low-voltage wireless communication systems

Shih-Hung Chen, Chun-Yen Chang, Li Chang, 2002 .

Impact of local interconnects on ESD design

Mirko Scholz, Shih-Hung Chen, Dimitri Linten, 2015, 2015 International Conference on IC Design & Technology (ICICDT).

System-Level ESD Protection Design Using On-Wafer Characterization and Transient Simulations

Gerd Vandersteen, Mirko Scholz, Shih-Hung Chen, 2014, IEEE Transactions on Device and Materials Reliability.

Phase-change random access memory: A scalable technology

Shih-Hung Chen, Daniel Krebs, Matthew J. Breitwisch, 2008, IBM J. Res. Dev..

Tunable ESD clamp for high-voltage power I/O pins of a battery charge circuit in mobile applications

Mirko Scholz, Shih-Hung Chen, Dimitri Linten, 2017, 2017 47th European Solid-State Device Research Conference (ESSDERC).

ESD characterisation of a-IGZO TFTs on Si and foil substrates

Mirko Scholz, Shih-Hung Chen, Dimitri Linten, 2017, 2017 47th European Solid-State Device Research Conference (ESSDERC).

Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition

Shih-Hung Chen, Ming-Dou Ker, 2009, 2009 International Symposium on VLSI Design, Automation and Test.

A bidirectional radio-on DWDM transport system for LAN and ITS applications

Shih-Hung Chen, Hai-Han Lu, Chien-Chou Chen, 2006 .

Transmission Rate Enhancement for Scalable H.264/AVC Video over MIMO Wireless Systems

Chia-Hung Yeh, Shih-Hung Chen, Wan-Jen Huang, 2009, PCM.

Off-State Degradation of High-Voltage-Tolerant nLDMOS-SCR ESD Devices

Shih-Hung Chen, S Thijs, A Griffoni, 2011, IEEE Transactions on Electron Devices.

Employing split-band technique and optical SSB filter to Improve directly modulated fiber optical CATV system performances

Shih-Hung Chen, Hai-Han Lu, Chien-Chou Chen, 2005, IEICE Electron. Express.

Image segmentation based on consensus voting

Shih-Hung Chen, Jung-Hua Wang, Ming-Jui Kuo, 2005, 2005 9th International Workshop on Cellular Neural Networks and Their Applications.

Failure analysis and solutions to overcome latchup failure event of a power controller IC in bulk CMOS technology

Shih-Hung Chen, Ming-Dou Ker, 2006, Microelectron. Reliab..

Circuit design to achieve whole-chip ESD protection for UXGA/HDTV LCOS IC product

Shih-Hung Chen, Ming-Dou Ker, Tang-Kui Tseng, 2004, The 2004 IEEE Asia-Pacific Conference on Circuits and Systems, 2004. Proceedings..

Bidirectional Hybrid DWDM-PON for HDTV/Gigabit Ethernet/CATV Applications

Shih-Hung Chen, Hai-Han Lu, Wen-Shing Tsai, 2007 .

CDM protection of a 3D TSV memory IC with a 100 GB/s wide I/O data bus

Mirko Scholz, Shih-Hung Chen, Dimitri Linten, 2014, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014.

ESD in FinFET technologies: Past learning and emerging challenges

G. Groeseneken, Shih-Hung Chen, G. Hellings, 2013, 2013 IEEE International Reliability Physics Symposium (IRPS).

P‐45: On‐Chip ESD Protection Design for UXGA/HDTV LCoS in 0.35‐μm CMOS Technology

Shih-Hung Chen, Ming-Dou Ker, Tang-Kui Tseng, 2004 .

Optimization on NMOS-based power-rail ESD clamp circuits with gate-driven mechanism in a 0.13-μm CMOS technology

Shih-Hung Chen, Ming-Dou Ker, 2008, 2008 15th IEEE International Conference on Electronics, Circuits and Systems.

Implementation of Initial-On ESD Protection Concept With PMOS-Triggered SCR Devices in Deep-Submicron CMOS Technology

Shih-Hung Chen, Ming-Dou Ker, 2007, IEEE Journal of Solid-State Circuits.

Impact of the on-chip and off-chip ESD protection network on transient-induced latch-up in CMOS IC

Mirko Scholz, Shih-Hung Chen, Dimitri Linten, 2013, 2013 35th Electrical Overstress/Electrostatic Discharge Symposium.

Impact of on- and off-chip protection on the transient-induced latch-up sensitivity of CMOS IC

Mirko Scholz, Shih-Hung Chen, Dimitri Linten, 2016, Microelectron. Reliab..

ESD protection design in active-lite interposer for 2.5 and 3D systems-in-package

Eric Beyne, Mirko Scholz, Shih-Hung Chen, 2015, 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).

Quasi-3D method: Time-efficient TCAD and mixed-mode simulations on finFET technologies

Mirko Scholz, Shih-Hung Chen, Dimitri Linten, 2013, Proceedings of the IEEE 2013 Custom Integrated Circuits Conference.

vfTLP characteristics of ESD devices in Si gate-all-around (GAA) nanowires

Naoto Horiguchi, Mirko Scholz, Shih-Hung Chen, 2016, 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).

Abnormal ESDDamagesOccurinInterface Circuits between Different PowerDomainsinND-ModeMM ESDStress

Shih-Hung Chen, Ming-Dou Ker, Hsiang-Pin Hung, 2006 .

ESD failure mechanisms of analog I/O cells in 0.18-/spl mu/m CMOS technology

Shih-Hung Chen, Ming-Dou Ker, Che-Hao Chuang, 2006 .

An automated IC chip marking inspection system for surface mounted devices on taping machines

Shih-Hung Chen, Te-Tan Liao, 2009 .

Comparison of System-Level ESD Design Methodologies—Towards the Efficient and ESD Robust Design of Systems

G. Groeseneken, Shih-Hung Chen, M. Sawada, 2013, IEEE Transactions on Device and Materials Reliability.

Local CDM ESD Protection Circuits for Cross-Power Domains in 3D IC Applications

Mirko Scholz, Shih-Hung Chen, Dimitri Linten, 2014, IEEE Transactions on Device and Materials Reliability.

Initial-On ESD Protection Design with PMOS-Triggered SCR Device

Shih-Hung Chen, Ming-Dou Ker, 2005, 2005 IEEE Asian Solid-State Circuits Conference.

Networked Collaborative Environment for Hydro-Engineering

Shih-Hung Chen, Jiunn-Horng Lee, Shin-Jye Liang, 2001, Int. J. Comput. Eng. Sci..

A highly scalable vertical gate (VG) 3D NAND Flash with robust program disturb immunity using a novel PN diode decoding structure

Shih-Hung Chen, Chih-Yuan Lu, Kuo-Pin Chang, 2011, 2011 Symposium on VLSI Technology - Digest of Technical Papers.

Area-Efficient ESD-Transient Detection Circuit With Smaller Capacitance for On-Chip Power-Rail ESD Protection in CMOS ICs

Shih-Hung Chen, Ming-Dou Ker, 2009, IEEE Transactions on Circuits and Systems II: Express Briefs.

Image segmentation via double pulse coupled neural network

Shih-Hung Chen, Jung-Hua Wang, Hou-Nien Chi, 2003, SMC'03 Conference Proceedings. 2003 IEEE International Conference on Systems, Man and Cybernetics. Conference Theme - System Security and Assurance (Cat. No.03CH37483).

Dynamic Resource Allocation for Scalable H.264/AVC Video Transmission over MIMO Wireless Systems

Chia-Hung Yeh, Shih-Hung Chen, Wan-Jen Huang, 2011, J. Signal Process. Syst..

Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits

Shih-Hung Chen, Ming-Dou Ker, 2007, Microelectron. Reliab..

Optimization ofPMOS-Triggered SCRDevices forOn-Chip ESD Protection ina0.18-gm CMOS Technology

Shih-Hung Chen, 2007 .

Optimization of PMOS-triggered SCR devices for on-chip ESD protection in a 0.18-μm CMOS technology

Shih-Hung Chen, Ming-Dou Ker, 2007, 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

A new failure mechanism on analog I/O cell under ND-mode ESD stress in deep-submicron CMOS technology

Shih-Hung Chen, Ming-Dou Ker, Che-Hao Chuang, 2005, Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005..

Social Network Data Retrieving Using Semantic Technology

Shih-Hung Chen, Ting-Han Su, Reen-Cheng Wang, 2013, 2013 IEEE 37th Annual Computer Software and Applications Conference Workshops.

Optimization on MOS-Triggered SCR Structures for On-Chip ESD Protection

Shih-Hung Chen, Ming-Dou Ker, 2009, IEEE Transactions on Electron Devices.

Active ESD Protection Design for Interface Circuits Between Separated Power Domains Against Cross-Power-Domain ESD Stresses

Shih-Hung Chen, Ming-Dou Ker, Hsiang-Pin Hung, 2008, IEEE Transactions on Device and Materials Reliability.

Overview of 3D NAND Flash and progress of vertical gate (VG) architecture

Shih-Hung Chen, Chih-Yuan Lu, Hang-Ting Lue, 2012, 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology.

Characteristics of a highly scalable bridge phase change memory

Shih-Hung Chen, Hsiang-Lan Lung, Huai-Yu Cheng, 2008, 2008 9th International Conference on Solid-State and Integrated-Circuit Technology.

Process Options Impact on ESD Diode Performance in Bulk FinFET Technology

Shih-Hung Chen, Dimitri Linten, Geert Hellings, 2016, IEEE Transactions on Electron Devices.

On gated diodes for ESD protection in bulk FinFET CMOS technology

Shih-Hung Chen, Dimitri Linten, Steven Thijs, 2011, EOS/ESD Symposium Proceedings.

A highly pitch scalable 3D vertical gate (VG) NAND flash decoded by a novel self-aligned independently controlled double gate (IDG) string select transistor (SSL)

Shih-Hung Chen, Chih-Yuan Lu, Kuo-Pin Chang, 2012, 2012 Symposium on VLSI Technology (VLSIT).

Investigation on seal-ring rules for IC product reliability in 0.25-mum CMOS technology

Shih-Hung Chen, Ming-Dou Ker, 2005, Microelectron. Reliab..