M. Igeta

Thermal characteristics of submicron vias studied by scanning Joule expansion microscopy

Chenming Hu, K. Banerjee, A. Majumdar, 2000, IEEE Electron Device Letters.

Investigation of self-heating phenomenon in small geometry vias using scanning Joule expansion microscopy

Kaustav Banerjee, A. Amerasekera, Chenming Hu, 1999, 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).