A Dávila

Wavelength scanning interferometry using multiple light sources.

A Dávila, 2016, Optics express.

Extreme shearing interferometry: theoretical limits with practical consequences.

M Cywiak, M. Servin, A. Dávila, 2007, Optics express.

Transient deformation analysis by a carrier method of pulsed electronic speckle-shearing pattern interferometry.

G. H. Kaufmann, G H Kaufmann, C. Pérez-López, 1998, Applied optics.