I. Dermoul

Drain-current DLTS study of an GaAs/InP MESFET

I. Dermoul, A Kalboussi, F. Chekir, 2000 .

Evidence of surface states for 4H-SiC MESFETs on semi-insulating substrates by current transient spectroscopy

N. Sghaier, I. Dermoul, F. Chekir, 2004, 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716).

Investigation of traps in AlGaN/GaN HEMTs by current transient spectroscopy

Christophe Gaquiere, I. Dermoul, F. Chekir, 2006 .