Teruki Mitsuyama

Simultaneous Measurement of Refractive Index and Thickness by Low Coherence Interferometry Considering Chromatic Dispersion of Index

Masato Ohmi, Masamitsu Haruna, Hideki Maruyama, 2000 .

Low-coherence interferometer system for the simultaneous measurement of refractive index and thickness.

Masato Ohmi, Masamitsu Haruna, Hideki Maruyama, 2002, Applied optics.