Chang-Tzu Wang

29.7 ESD Protection for Mixed-Voltage I/O in Low-

Ming-Dou Ker, Voltage Thin-Oxide Cmos, Wei-Jen Chang, 2006 .

Design of Power-Rail ESD Clamp Circuit With Ultra-Low Standby Leakage Current in Nanoscale CMOS Technology

Ming-Dou Ker, Chang-Tzu Wang, 2009, IEEE J. Solid State Circuits.

ESD protection design with lateral DMOS transistor in 40-V BCD technology

Ming-Dou Ker, Tien-Hao Tang, Kuan-Cheng Su, 2010, 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

ESD protection design with lateral DMOS transistor in 40-V BCD technology

Ming-Dou Ker, Tien-Hao Tang, Kuan-Cheng Su, 2010, IPFA 2010.

ESD protection design with adjustable snapback behavior for 5-V application in 100nm CMOS process

Tien-Hao Tang, Kuan-Cheng Su, Yu-Chun Chen, 2013, 2013 IEEE International Reliability Physics Symposium (IRPS).

Low-leakage electrostatic discharge protection circuit in 65-nm fully-silicided CMOS technology

Ming-Dou Ker, Tien-Hao Tang, Kuan-Cheng Su, 2009, 2009 IEEE International Conference on IC Design and Technology.

ESD Protection for Mixed-Voltage I/O in LowVoltage Thin-Oxide CMOS

Ming-Dou Ker, Wen-Yi Chen, Wei-Jen Chang, 2006, 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers.

Design of 2$\times$VDD-Tolerant Power-Rail ESD Clamp Circuit With Consideration of Gate Leakage Current in 65-nm CMOS Technology

Ming-Dou Ker, Chang-Tzu Wang, 2010, IEEE Transactions on Electron Devices.

Design of High-Voltage-Tolerant ESD Protection Circuit in Low-Voltage CMOS Processes

Ming-Dou Ker, Chang-Tzu Wang, 2009 .

Latch-up free ESD protection design with SCR structure in advanced CMOS technology

Tien-Hao Tang, Kuan-Cheng Su, Chang-Tzu Wang, 2011, 2011 International Reliability Physics Symposium.

Circuit solutions on ESD protection design for mixed-voltage I/O buffers in nanoscale CMOS

Ming-Dou Ker, Chang-Tzu Wang, 2009, 2009 IEEE Custom Integrated Circuits Conference.

The modified P+ electrode layout schemes to enhance esd robustness of SCR structure for PMIC applications

Tien-Hao Tang, Kuan-Cheng Su, Chang-Tzu Wang, 2011, 2011 International Reliability Physics Symposium.