Dakai Chen

发表

Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

Michael J. Campola, Martha V. O'Bryan, Donna J. Cochran, 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).

Radiation Effects of Commercial Resistive Random Access Memories

Kenneth A. LaBel, Nicolas Roche, Melanie D. Berg, 2014 .

Dakai Chen, Philippe C. Adell, G. R. Allen, 2012 .

Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

Martha V. O'Bryan, Edward P. Wilcox, Donna J. Cochran, 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).

Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA

P. W. Marshall, K. A. LaBel, Dakai Chen, 2012, 2012 IEEE Radiation Effects Data Workshop.

Functional Interrupts and Destructive Failures from Single Event Effect Testing of Point-Of-Load Devices

Kenneth A. LaBel, Dakai Chen, Hak Kim, 2013 .

NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

Kenneth A. LaBel, Edward J. Wyrwas, Carl M. Szabo, 2018, 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).

Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems

Martin A. Carts, Michael J. Campola, Martha V. O'Bryan, 2010, 2011 IEEE Radiation Effects Data Workshop.

SEE transient response of Crane Electronics Single Output Point of Load DC-DC Converters

Dakai Chen, Anthony M. Phan, Hak S. Kim, 2011, 2011 12th European Conference on Radiation and Its Effects on Components and Systems.

Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

Martin A. Carts, Michael J. Campola, Martha V. O'Bryan, 2010, 2010 IEEE Radiation Effects Data Workshop.

Compendium of Total Ionizing Dose and Displacement Damage Results from NASA Goddard Spaceflight Center

Michael J. Campola, Martha V. O'Bryan, Donna J. Cochran, 2016, 2016 IEEE Radiation Effects Data Workshop (REDW).

kW-level high brightness blue diode laser

Weirong Guo, Dakai Chen, Dongchen Jin, 2021, LASE.

Single-Event Transient Testing of Low Dropout PNP Series Linear Voltage Regulators

P. C. Adell, Dakai Chen, G. R. Allen, 2012, IEEE Transactions on Nuclear Science.

Destructive Single-Event Failures in Diodes

Kenneth A. LaBel, Dakai Chen, Robert A. Gigliuto, 2013 .

Compendium of Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

K. A. LaBel, Dakai Chen, M. V. O'Bryan, 2012, 2012 IEEE Radiation Effects Data Workshop.

Enhanced Low Dose Rate Sensitivity at Ultra-Low Dose Rates

K. LaBel, K. Kruckmeyer, Dakai Chen, 2011, IEEE Transactions on Nuclear Science.

The Effects of Elevated Temperature on Pulsed-Laser-Induced Single Event Transients in Analog Devices

H.S. Kim, Dakai Chen, D. McMorrow, 2009, IEEE Transactions on Nuclear Science.

Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

Farokh Irom, Kenneth A. LaBel, Martha V. O'Bryan, 2010, 2010 IEEE Radiation Effects Data Workshop.

Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

David F. Heidel, Kenneth A. LaBel, Michael J. Campola, 2010, 2011 IEEE Radiation Effects Data Workshop.

Compendium of Recent Single Event Effects for Candidate Spacecraft Electronics for NASA

Kenneth A. LaBel, Michael J. Campola, Martha V. O'Bryan, 2013, 2013 IEEE Radiation Effects Data Workshop (REDW).

Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

Kenneth A. LaBel, Michael J. Campola, Martha V. O'Bryan, 2009, 2009 IEEE Radiation Effects Data Workshop.

Mechanisms and Temperature Dependence of Single Event Latchup Observed in a CMOS Readout Integrated Circuit From 16–300 K

Augustyn Waczynski, Dakai Chen, Emily Kan, 2010, IEEE Transactions on Nuclear Science.

Total Ionizing Dose Test Report for the AD9364 RF Transceiver

Dakai Chen, Tim Mondy, 2017 .

Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets in a NAND Flash Memory

Kenneth A. LaBel, Dakai Chen, Raymond L. Ladbury, 2017, IEEE Transactions on Nuclear Science.

Radiation Performance of Commercial SiGe HBT BiCMOS High Speed Operational Amplifiers

Jonathan Pellish, Dakai Chen, Sam Burns, 2010, 2010 IEEE Radiation Effects Data Workshop.

Temperature-Dependence of Off-State Drain Leakage in X-Ray Irradiated 130 nm CMOS Devices

M. Turowski, A. Raman, Bongim Jun, 2006, IEEE Transactions on Nuclear Science.

Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA

Kenneth A. LaBel, Michael J. Campola, Martha V. O'Bryan, 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).