Jonathan A. Pellish

发表

Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

Michael J. Campola, Martha V. O'Bryan, Donna J. Cochran, 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).

Practicality of evaluating soft errors in commercial sub-90 nm CMOS for space applications

Kenneth A. LaBel, Jonathan A. Pellish, K. Label, 2010, 2010 IEEE International Reliability Physics Symposium.

Editor comments

Jonathan A. Pellish, Pascale Gouker, Veronique Ferlet-Cavrois, 2013 .

Single Event Effects in FPGA Devices 2015-2016

Kenneth A. LaBel, Jonathan A. Pellish, Melanie D. Berg, 2016 .

Xilinx Virtex-5QV (V5QV) Independent SEU Data

Kenneth A. LaBel, Jonathan A. Pellish, Melanie D. Berg, 2014 .

Single Event Induced Multiple Bit Errors and the Effects of Logic Masking

Kenneth A. LaBel, Jonathan A. Pellish, Melanie D. Berg, 2013, IEEE Transactions on Nuclear Science.

Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

Martha V. O'Bryan, Edward P. Wilcox, Donna J. Cochran, 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).

Advanced CMOS Radiation Effects Testing Analysis

Kenneth A. LaBel, Jonathan A. Pellish, Anthony M. Phan, 2014 .

NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

Kenneth A. LaBel, Edward J. Wyrwas, Carl M. Szabo, 2018, 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).

Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems

Martin A. Carts, Michael J. Campola, Martha V. O'Bryan, 2010, 2011 IEEE Radiation Effects Data Workshop.

NASA EEE Parts and NASA Electronic Parts and Packaging (NEPP) Program Update 2018

Kenneth A. LaBel, Michael J. Sampson, Peter Majewicz, 2018 .

Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

Martin A. Carts, Michael J. Campola, Martha V. O'Bryan, 2010, 2010 IEEE Radiation Effects Data Workshop.

On Nibbles and Bytes: The Conundrum of Memory for Space Systems - NASA Electronic Parts and Packaging (NEPP) and Efforts in Memories

Kenneth A. LaBel, Lewis M. Cohn, Douglas Sheldon, 2009 .

PART III OF THREE PARTS

John D. Cressler, M. L. Alles, Ronald D. Schrimpf, 2008 .

IEEE Nuclear and Space Radiation Effects Conference: Notes on the Early Conferences

Kenneth F. Galloway, Jonathan A. Pellish, K. Galloway, 2013, IEEE Transactions on Nuclear Science.

Localized Triple Modular Redundancy vs. Distributed Triple Modular Redundancy on a ProASIC3E Reprogrammable FPGA

Jonathan A. Pellish, Melanie D. Berg, Alex McGuffey, 2010 .

Compendium of Total Ionizing Dose and Displacement Damage Results from NASA Goddard Spaceflight Center

Michael J. Campola, Martha V. O'Bryan, Donna J. Cochran, 2016, 2016 IEEE Radiation Effects Data Workshop (REDW).

Single-Event Transient Case Study for System-Level Radiation Effects Analysis

Michael J. Campola, Jonathan A. Pellish, Raymond L. Ladbury, 2021, IEEE Transactions on Nuclear Science.

Proton-induced SEU in SiGe digital logic at cryogenic temperatures

John D. Cressler, Michael L. Alles, Paul W. Marshall, 2007 .

A Robust Strategy for Total Ionizing Dose Testing of Field Programmable Gate Arrays

Kenneth A. LaBel, Jonathan A. Pellish, Edward P. Wilcox, 2012 .

Estimation of Heavy-Ion LET Thresholds in Advanced SOI IC Technologies From Two-Photon Absorption Laser Measurements

David F. Heidel, Kenneth A. LaBel, Veronique Ferlet-Cavrois, 2009, IEEE Transactions on Nuclear Science.

Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

Farokh Irom, Kenneth A. LaBel, Martha V. O'Bryan, 2010, 2010 IEEE Radiation Effects Data Workshop.

Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

David F. Heidel, Kenneth A. LaBel, Michael J. Campola, 2010, 2011 IEEE Radiation Effects Data Workshop.

Compendium of Recent Single Event Effects for Candidate Spacecraft Electronics for NASA

Kenneth A. LaBel, Michael J. Campola, Martha V. O'Bryan, 2013, 2013 IEEE Radiation Effects Data Workshop (REDW).

Estimation of Heavy-Ion LET Thresholds in Advanced SOI IC Technologies From Two-Photon Absorption Laser Measurements

David F. Heidel, Kenneth A. LaBel, Veronique Ferlet-Cavrois, 2009 .

Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

Kenneth A. LaBel, Michael J. Campola, Martha V. O'Bryan, 2009, 2009 IEEE Radiation Effects Data Workshop.

Technology Options for Extreme Environment Electronics

Lewis M. Cohn, Jonathan A. Pellish, Jonathan A. Pellish, 2012 .

Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA

Kenneth A. LaBel, Michael J. Campola, Martha V. O'Bryan, 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).