R. Ho

Scans along arbitrary directions in reciprocal space and the analysis of GaN films on SiC

M. Goorsky, M. Wojtowicz, S. Hayashi, 2005 .

Processing dependence of the interfacial microstructure of Ag contacts to YBa2Cu3O7−δ thin films

J. Grepstad, R. Ho, Z. Gong, 1993 .

X-ray scattering techniques for the measurement of InP substrates

M. Goorsky, A. Noori, S. Hayashi, 2004, 16th IPRM. 2004 International Conference on Indium Phosphide and Related Materials, 2004..

Investigations of magnetic properties and microstructure of 40Cedidymium–Fe–B based magnets

R. Ho, S. Zhou, Y. Wang, 1994 .

Transmission electron microscopy study of Ag contacts to a‐ and c‐axis oriented YBa2Cu3O7 thin films

J. Grepstad, R. Ho, Z. Gong, 1992 .