A. Andrle
发表
F. Scholze,
B. Beckhoff,
T. Weimann,
2020,
Nanotechnology.
R. Loo,
B. Beckhoff,
M. Steinert,
2021,
Small.
B. Kanngießer,
B. Beckhoff,
H. Stiel,
2022,
Nanomaterials.
R. Ciesielski,
V. Philipsen,
S. Brose,
2022,
European Mask and Lithography Conference.
M. Krumrey,
T. Siefke,
K. Nikolaev,
2022,
Nanoscale.
F. Scholze,
J. Vinson,
S. Heidenreich,
2020,
Journal of applied crystallography.
Jena,
Belgium,
H Germany,
2021,
Optics Express.
F. Scholze,
V. Philipsen,
A. Erdmann,
2022,
Photomask Technology.
Gabriele Steidl,
Victor Soltwisch,
Nando Farchmin,
2021,
SSVM.
A. Hikavyy,
A. Veloso,
R. Loo,
2023,
Advanced Lithography.
F. Siewert,
G. Gwalt,
P. Hönicke,
2021,
Nanomaterials.
Victor Soltwisch,
Philipp Hönicke,
Analía Fernández Herrero,
2021,
Optical Metrology.
Victor Soltwisch,
Martin Hammerschmidt,
Burkhard Beckhoff,
2019,
Optical Metrology.