Haldun Kufluoglu

Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis

Kaushik Roy, Kunhyuk Kang, Haldun Kufluoglu, 2007, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Temporal Performance Degradation under NBTI: Estimation and Design for Improved Reliability of Nanoscale Circuits

Kaushik Roy, Bipul Chandra Paul, Kunhyuk Kang, 2006, Proceedings of the Design Automation & Test in Europe Conference.

An extensive and improved circuit simulation methodology for NBTI recovery

T. Ragheb, Haldun Kufluoglu, V. Reddy, 2010, 2010 IEEE International Reliability Physics Symposium.

Recovery modeling of negative bias temperature instability (NBTI) for SPICE-compatible circuit aging simulators

Min Chen, Haldun Kufluoglu, Vijay Reddy, 2014, JETC.

A comprehensive model for PMOS NBTI degradation: Recent progress

D. Varghese, Haldun Kufluoglu, Muhammad Ashraful Alam, 2007, Microelectron. Reliab..

A physical and scalable aging model for digital library characterization

Haldun Kufluoglu, C. Cirba, V. Reddy, 2014, 2014 IEEE International Reliability Physics Symposium.

Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits

Kaushik Roy, Bipul Chandra Paul, Kunhyuk Kang, 2007, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI

Kaushik Roy, Kunhyuk Kang, Haldun Kufluoglu, 2006, 2006 International Conference on Computer Design.