H. Boudriot

发表

Influence of the structure of InP thin films on electron energy loss spectra

R. Gründler, H. Boudriot, K. Deus, 1989 .

Some properties of reactively sputtered tin lead oxide films

J. Szczyrbowski, A. Czapla, M. Jachimowski, 1983 .

Influence of film structure on the electron energy loss spectra of GaAs thin films

R. Gründler, E. Kusior, H. Boudriot, 1983 .

Compensation in GaAs : Si in correlation to As pressure during the crystal growth

H. Boudriot, K. Deus, W. Siegel, 1994 .

Electron Energy Loss Measurements on CdSnP2: Plasmon Data, Dielectric Function, Band Structure Data

R. Gründler, H. Boudriot, K. Deus, 1984, December 1.

Contribution to the Si doping of bridgeman GaAs

H. Boudriot, K. Deus, W. Siegel, 1989 .

Optical Properties of Single-Crystalline ZnSiP2 from Electron Energy Loss Measurements between 3 and 40 eV

R. Gründler, H. Boudriot, K. Deus, 1981 .

Refractive index and double refraction of ZnSiP2 in the visible and near infrared spectral range in dependence on wavelength

H. Boudriot, H. Schneider, B. Fölber, 1975 .

Volume Plasmon Dispersion of Polycrystalline GaP and InP

R. Gründler, H. Boudriot, T. Stöckert, 1984, June 1.