B. Cheek

Investigation of circuit-level oxide degradation and its effect on CMOS inverter operation and MOSFET characteristics

R.J. Baker, R. J. Baker, W. B. Knowlton, 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.

Gate dielectric degradation effects on nMOS devices using a noise model approach

R. J. Baker, W. B. Knowlton, A. Haggag, 2003, Proceedings of the 15th Biennial University/Government/ Industry Microelectronics Symposium (Cat. No.03CH37488).

Gate Dielectric Degradation Effects on nMOS Devices and Simple IC Building Blocks ( SICBBs )

W. B. Knowlton, A. Moll, T. Caldwell, 2002 .

Preliminary study of NOR digital response to single pMOSFET dielectric degradation

R. J. Baker, W. B. Knowlton, G. Bersuker, 2006, 2006 IEEE Workshop on Microelectronics and Electron Devices, 2006. WMED '06..

Survey of oxide degradation in inverter circuits using 2.0 nm MOS devices

G. Bersuker, R.J. Baker, R. J. Baker, 2004, IEEE International Integrated Reliability Workshop Final Report, 2004.