G. Grula

Degradation characteristics of STI and MESA-isolated thin-film SOI CMOS

Cheng-Liang Huang, G. Grula, 1997, IEEE Electron Device Letters.

Stress induced defects and transistor leakage for shallow trench isolated SOI

J. Sleight, G.J. Grula, J.W. Sleight, 1999, IEEE Electron Device Letters.

Isolation process dependence of channel mobility in thin-film SOI devices

D. Antoniadis, D. Antoniadis, N. Arora, 1996, IEEE Electron Device Letters.

Parasitic bipolar gain reduction and the optimization of 0.25-/spl mu/m partially depleted SOI MOSFETs

Dimitri A. Antoniadis, Jeffrey W. Sleight, Robert Flatley, 1999 .