A. He

Supply Voltage Dependence of Heavy Ion Induced SEEs on 65 nm CMOS Bulk SRAMs

Li Chen, Richard Wong, Rui Liu, 2015, IEEE Transactions on Nuclear Science.

Experimental research of heavy ion and proton induced single event effects for a Bi-CMOS technology DC/DC converter

G. Guo, S. Shi, L. Cai, 2015 .

Experimental study of temperature dependence of single-event upset in SRAMs

G. Guo, S. Shi, L. Cai, 2016 .

A 65 nm Temporally Hardened Flip-Flop Circuit

Qiong Wu, Mo Chen, Shi-Jie Wen, 2016, IEEE Transactions on Nuclear Science.